UNITES

SEMICONDUCTOR TESTING

High Speed Testing of small signal discrete semiconductor, wafer/package level

High accuracy laboratory testing

Universal Laboratory Tester for Semiconductors

Capacitance measurements,

SCADUS Control Software

Applications:

For Bipolar transistors, FET,MOSFET, JFET, Diodes (Photodiode/Zenner), LEDs, Rectifiers etc

Incoming inspection, Component characterization/qualification, Failure Analysis.

SEMICONDUCTOR TEST PLATFORMS High-speed testing of discrete semiconductors – wafer / package level

Effitest e50 series

EFFITEST e50 series is ultra high-speed discrete semiconductor tester perfect for use in production. Throughput up to 60.000 UPH. Ideal for testing small signal transistors, diodes, LEDs, MOSFETs, JFETs and other semiconductors up to 800V / 20A. Lowest current range is 10nA. Ideal also for GaN and SiC transistors. Effitest e50 series offers 3 models – e50, e51 and e52, all in single, dual and quad configuration.

Effitest p900 series

Effitest p900 series is top-class high-speed test system for mass production of power discrete semiconductors. It is based on Effitest power test platform with extension of high voltage and high current modules. With this configuration, Effitest p900 is an ideal choice for testing IGBTs, MOS-FETs and other high power semiconductors.

Features:

  • Effitest e50 max. ranges up to 600V/6A

  • Effitest e51 max. ranges up to 800V/10A

  • Effitest e52 max. ranges up to 800V/20A

  • Single (3 pin), Dual (e50, 3 + 3 pin) and Quad (e90, 3 + 3 + 3 + 3 pin) configuration

  • Pincount extendable up to 10 pins by external multiplexer MUX10

  • Connection to a handler or a wafer prober

  • Up to 32 HW bins and 256 SW bins

  • Throughput up to 72,000 UPH / less than 35 ms to test a bipolar transistor

  • Parallel and serial testing

  • Virtual scope – internal instrument allowing display of waveforms

  • Menu-driven test editor for easy programming test programs

  • Final test & QA test ready