Semiconductor Test Equipment

UNITES

UNITES Systems a.s. is a private company located in the Czech Republic founded in 1991. We have long experience in development and production of semiconductor testers – ATEs (Automatic Test Equipment).

We offer universal component testers for incoming inspections, high speed testers for mass production, worldwide full life-cycle support for ATEs (particulary for SZ M3000), development and production of test applications, turnkey development to meet customers specific demands and contract manufacturing (OEM). Our testers are sold with original operational software called SCADUS.

Semiconductor testing for production

Effitest e50 series

EFFITEST e50 series is ultra high-speed discrete semiconductor tester perfect for use in production. Throughput up to 60.000 UPH. Ideal for testing small signal transistors, diodes, LEDs, MOSFETs, JFETs and other semiconductors up to 800V / 20A. Lowest current range is 10nA. Ideal also for GaN and SiC transistors. Effitest e50 series offers 3 models – e50, e51 and e52, all in single, dual and quad configuration.

Effitest p900 series

Effitest p900 series is top-class high-speed test system for mass production of power discrete semiconductors. It is based on Effitest power test platform with extension of high voltage and high current modules. With this configuration, Effitest p900 is an ideal choice for testing IGBTs, MOS-FETs and other high power semiconductors.

Semiconductor testing for laboratory

UNIMET 2020

UNIMET 2020 represents a unique and flexible linear and mixed signal test platform for cost effective testing of a wide range of components. UNIMET 2020 is fully compatible with SZ M3000 test system. UNIMET platform consists of dozens of test adapters with hundreds of ready made test programs. It can be easily connected to any type of standard handler via TCP/IP, IOs or RS232. Together with various TAs (Test Adapters), UNIMET represents an ideal choice for RAD-HARD component testing. UNIMET 2020 used without TAs, makes an ideal choice for ASIC testing.

UNIMET 1037

UNIMET 1037 is laboratory benchtop test system for discrete semiconductors such as bipolar transistors, IGBTs, MOSFETs, diodes, Zener diodes, triacs and thyristors. It could be easily connected with any type of standard handler via TCP/IP, IOs or RS232. Advanced dynamic measurements are available with TA37.TIM extension.